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Dell EMC Exam E20-585 Topic 1 Question 22 Discussion
Actual exam question for
Dell EMC's
E20-585 exam
Question #: 22
Topic #: 1
[All E20-585 Questions]
Topic #: 1
Which technique is used to identify the duplicate segments in the SISL process used by Dell EMC Data Domain?
Suggested Answer:
D
The summary vector and segment locality techniques identify 99% of the duplicate segments in RAM (Inline) before storing to disk.
References:
https://www.emc.com/collateral/hardware/white-papers/h7221-data-domain-sisl-sclg-arch-wp.pdf
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